VulnerabilityAnalyzed
CVE-2025-21449
Transient DOS may occur while processing malformed length field in SSID IEs.
HIGH 7.5EPSS 0.20%
Does this matter?
High impact if exploited, but EPSS currently rates exploitation as unlikely (0.20%). Schedule it in the normal patch cycle and watch for a rise in EPSS or a public exploit.
Description
Transient DOS may occur while processing malformed length field in SSID IEs.
- CVSS 3.1
- 7.5 HIGHCVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H
- EPSS
- 0.20% probability · 10th percentile
- CISA KEV
- Not listed
- Weakness
- CWE-126, CWE-125
- Affected
- qualcomm/sm8635p firmware · qualcomm/sm8650q firmware · qualcomm/sm8735 firmware · qualcomm/sm8750 firmware · qualcomm/sm8750p firmware · qualcomm/smart audio 200 platform firmware · qualcomm/smart audio 400 platform firmware · qualcomm/snapdragon 4 gen 1 mobile firmware · qualcomm/snapdragon 4 gen 2 mobile firmware · qualcomm/snapdragon 460 mobile firmware · qualcomm/snapdragon 480 5g mobile firmware · qualcomm/snapdragon 480\+ 5g mobile firmware · qualcomm/snapdragon 660 mobile firmware · qualcomm/snapdragon 662 mobile firmware · qualcomm/snapdragon 665 mobile firmware · qualcomm/snapdragon 670 mobile firmware · qualcomm/snapdragon 675 mobile firmware · qualcomm/snapdragon 678 mobile firmware · qualcomm/snapdragon 680 4g mobile firmware · qualcomm/snapdragon 685 4g mobile firmware · +40 more
- Source
- product-security@qualcomm.com
References
Source: NVD record, EPSS from FIRST.org, KEV from CISA. Refreshed daily.