VulnerabilityAnalyzed
CVE-2024-53017
Memory corruption while handling test pattern generator IOCTL command.
MEDIUM 6.6EPSS 0.09%
Does this matter?
Lower severity and a low EPSS score (0.09%). Track it; it rarely justifies an emergency change on its own.
Description
Memory corruption while handling test pattern generator IOCTL command.
- CVSS 3.1
- 6.6 MEDIUMCVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
- EPSS
- 0.09% probability · 1th percentile
- CISA KEV
- Not listed
- Weakness
- CWE-823
- Affected
- qualcomm/sdm429w firmware · qualcomm/snapdragon 429 mobile platform firmware · qualcomm/wcn3620 firmware · qualcomm/wcn3660b firmware
- Source
- product-security@qualcomm.com
References
Source: NVD record, EPSS from FIRST.org, KEV from CISA. Refreshed daily.