VulnerabilityAnalyzed

CVE-2024-53017

Memory corruption while handling test pattern generator IOCTL command.

MEDIUM 6.6EPSS 0.09%

Does this matter?

Lower severity and a low EPSS score (0.09%). Track it; it rarely justifies an emergency change on its own.

Description

Memory corruption while handling test pattern generator IOCTL command.

CVSS 3.1: 6.6 MEDIUMCVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
EPSS: 0.09% probability · 1th percentile
Public exploits: None in Exploit-DB
CISA KEV: Not listed
Weakness: CWE-823
Affected: qualcomm/sdm429w firmware · qualcomm/snapdragon 429 mobile platform firmware · qualcomm/wcn3620 firmware · qualcomm/wcn3660b firmware
Source: product-security@qualcomm.com

EPSS trend

EPSS 0.1% since 26 October 2026; no change recorded yet. Points are recorded when the score first appears and whenever it moves by a percentage point or more.

References

https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.htmlVendor Advisory

Source: NVD record, EPSS from FIRST.org, KEV from CISA, exploits from Exploit-DB. Refreshed daily. Download this record as JSON.