VulnerabilityAnalyzed
CVE-2024-45573
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
HIGH 7.8EPSS 0.10%
Does this matter?
High impact if exploited, but EPSS currently rates exploitation as unlikely (0.10%). Schedule it in the normal patch cycle and watch for a rise in EPSS or a public exploit.
Description
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
- CVSS 3.1
- 7.8 HIGHCVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
- EPSS
- 0.10% probability · 1th percentile
- CISA KEV
- Not listed
- Weakness
- CWE-823, CWE-119
- Affected
- qualcomm/fastconnect 6700 firmware · qualcomm/fastconnect 6900 firmware · qualcomm/fastconnect 7800 firmware · qualcomm/qcm5430 firmware · qualcomm/qcm6490 firmware · qualcomm/qcs5430 firmware · qualcomm/qcs6490 firmware · qualcomm/video collaboration vc3 platform firmware · qualcomm/sc8380xp firmware · qualcomm/sdm429w firmware · qualcomm/snapdragon 429 mobile firmware · qualcomm/snapdragon 7c\+ gen 3 compute firmware · qualcomm/sc8280xp-abbb firmware · qualcomm/wcd9370 firmware · qualcomm/wcd9375 firmware · qualcomm/wcd9380 firmware · qualcomm/wcd9385 firmware · qualcomm/wcn3620 firmware · qualcomm/wcn3660b firmware · qualcomm/wsa8830 firmware · +4 more
- Source
- product-security@qualcomm.com
References
Source: NVD record, EPSS from FIRST.org, KEV from CISA. Refreshed daily.