CVE-2022-35858
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a…
Does this matter?
High impact if exploited, but EPSS currently rates exploitation as unlikely (0.40%). Schedule it in the normal patch cycle and watch for a rise in EPSS or a public exploit.
Description
The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.
- CVSS 3.1
- 7.8 HIGHCVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
- EPSS
- 0.40% probability · 33th percentile
- CISA KEV
- Not listed
- Weakness
- CWE-401
- Affected
- samsung/mtower
- Source
- cve@mitre.org
References
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api_objects.c#L283Exploit, Third Party Advisory
- https://github.com/Samsung/mTower/issues/71Third Party Advisory
- https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api_objects.c#L283Exploit, Third Party Advisory
- https://github.com/Samsung/mTower/issues/71Third Party Advisory
Source: NVD record, EPSS from FIRST.org, KEV from CISA. Refreshed daily.