VulnerabilityModified
CVE-2019-20607
A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution.
CRITICAL 9.8EPSS 0.88%
Does this matter?
High impact if exploited, but EPSS currently rates exploitation as unlikely (0.88%). Schedule it in the normal patch cycle and watch for a rise in EPSS or a public exploit.
Description
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
- CVSS 3.1
- 9.8 CRITICALCVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
- EPSS
- 0.88% probability · 57th percentile
- CISA KEV
- Not listed
- Weakness
- CWE-787
- Affected
- google/android
- Source
- cve@mitre.org
References
- https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
- https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
Source: NVD record, EPSS from FIRST.org, KEV from CISA. Refreshed daily.