{"id":"CVE-2024-53017","url":"https://www.cyber-defence.io/tools/cve/CVE-2024-53017","generatedAt":"2026-10-28T01:44:54.798Z","title":"Memory corruption while handling test pattern generator IOCTL command.","description":"Memory corruption while handling test pattern generator IOCTL command.","published":"2025-06-03T06:15:25.000Z","lastModified":"2026-06-17T08:08:03.000Z","status":"Analyzed","sourceIdentifier":"product-security@qualcomm.com","cvss":{"version":"3.1","score":6.6,"severity":"MEDIUM","vector":"CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L"},"cwe":["CWE-823"],"affected":["qualcomm/sdm429w firmware","qualcomm/snapdragon 429 mobile platform firmware","qualcomm/wcn3620 firmware","qualcomm/wcn3660b firmware"],"epss":{"score":0.00093,"percentile":0.00521,"date":"2026-10-26","history":[]},"kev":{"listed":false},"exploits":{"count":0,"verified":false,"firstPublished":null,"source":"Exploit-DB (https://gitlab.com/exploit-database/exploitdb)","entries":[]},"verdict":{"level":"low","text":"Lower severity and a low EPSS score (0.09%). Track it; it rarely justifies an emergency change on its own."},"changes":[],"references":[{"url":"https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html","tags":["Vendor Advisory"],"source":"product-security@qualcomm.com"}],"sources":{"nvd":"https://nvd.nist.gov/vuln/detail/CVE-2024-53017","epss":"https://www.first.org/epss/","kev":"https://www.cisa.gov/known-exploited-vulnerabilities-catalog","exploitdb":"https://www.exploit-db.com/"},"licence":"CC BY 4.0 — link back to the CVE Explorer if you publish the results; upstream data remains subject to its own terms."}